Automatic Detection and Recognition of Engineered Nanoparticles in SEM Images. - Stephen Kockentiedt; Klaus D. Tönnies; Erhardt Gierke; Nico Dziurowitz; Carmen Thim; Sabine Plitzko (VMV, 2012)

Poisson shot noise parameter estimation from a single scanning electron microscopy image. - Stephen Kockentiedt; Klaus D. Tönnies; Erhardt Gierke; Nico Dziurowitz; Carmen Thim; Sabine Plitzko (Image Processing: Algorithms and Systems, 2013)

Improved Automatic Recognition of Engineered Nanoparticles in Scanning Electron Microscopy Images. - Stephen Kockentiedt; Klaus D. Tönnies; Erhardt Gierke; Nico Dziurowitz; Carmen Thim; Sabine Plitzko (VISAPP (2), 2015)