Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology. - Marcello Calabrese; Carmine Miccoli; Christian Monzio Compagnoni; Luca Chiavarone; Silvia Beltrami; Andrea Parisi; Sebastiano Bartolone; Andrea L. Lacaita; Alessandro S. Spinelli; Angelo Visconti (ICICDT, 2013)

Investigation of the emerging physical mechanisms limiting the reliability of nanoscale Flash memories. - Carmine Miccoli (2013)

Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays. - Carmine Miccoli; Giovanni M. Paolucci; Christian Monzio Compagnoni; Alessandro S. Spinelli; Akira Goda (IRPS, 2015)

Physical Model and Characteristics of 3D NAND Memory Cell Metastability Issues under High Temperature Stress. - Andrew Bicksler; Carmine Miccoli; Srinath Venkatesan (IMW, 2023)

Evidence of Carbon Doping Effect on VTH Drift and Dynamic-RON of 100V p-GaN Gate AlGaN/GaN HEMTs. - Marcello Cioni; G. Giorgino; Alessandro Chini; Carmine Miccoli; Maria Eloisa Castagna; M. Moschetti; C. Tringali; Ferdinando Iucolano (IRPS, 2023)