CAE Functionality for Verification of Diagnostic Programs. - Carol Pyron; Rex Sallade (ITC, 1989)

Representing Boundary Scan Tests with the EDIF Test View. - Carol Pyron (ITC, 1991)

EDIF Test - The Upcoming Standard for Test Data Transfers. - Michael G. Wahl; Carol Pyron (ITC, 1992)

Implementing 1149.1 in the PowerPCTM RISC Microprocessor Family. - Carol Pyron; William C. Bruce (ITC, 1995)

Next-Generation PowerPCTM Microprocessor Test Strategy Improvements. - Carol Pyron; Javier Prado; James Golab (ITC, 1997)

Test Strategy for the PowerPC 750 Microprocessor. - Carol Pyron; Javier Prado; James Golab (IEEE Des. Test Comput., 1998)

DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. - Carol Pyron; Mike Alexander; James Golab; George Joos; Bruce Long; Robert F. Molyneaux; Rajesh Raina; Nandu Tendolkar (ITC, 1999)

At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor. - Nandu Tendolkar; Robert F. Molyneaux; Carol Pyron; Rajesh Raina (VTS, 2000)

valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. - John Gatej; Lee Song; Carol Pyron; Rajesh Raina; Tom Munns (ITC, 2002)

Scan and BIST Can Almost Achieve Test Quality Levels. - Carol Pyron (ITC, 2002)

Silicon Symptoms to Solutions: Applying Design for Debug Techniques. - Carol Pyron; Rekha Bangalore; Dawit Belete; Jason Goertz; Ashutosh Razdan; Denise Younger (ITC, 2002)

An automated method for test model generation from switch level circuits. - Tim McDougall; Atanas N. Parashkevov; Simon Jolly; Juhong Zhu; Jing Zeng; Carol Pyron; Magdy S. Abadir (ASP-DAC, 2003)

Automated Test Model Generation from Switch Level Custom Circuits. - Magdy S. Abadir; Jing Zeng; Carol Pyron; Juhong Zhu (Asian Test Symposium, 2003)