Manufacturing Pattern Development for the Alpha 21164 Microprocessor. - Carol Stolicny; Richard Davies; Pamela McKernan; Tuyen Truong (ITC, 1997)

Alpha 21164 Manufacturing Test Development and Coverage Analysis. - Carol Stolicny; Richard Davies; Pamela McKernan; Tuyen Truong (IEEE Des. Test Comput., 1998)

ITC 2002 Panels. - Carol Stolicny (IEEE Des. Test Comput., 2003)

ITC 2002 Panels: Part 2. - Carol Stolicny (IEEE Des. Test Comput., 2003)

ITC 2003 panels: Part 1. - Carol Stolicny; Tapio Koivukangas; Rubin A. Parekhji; Ian G. Harris; Rob Aitken (IEEE Des. Test Comput., 2004)

ITC 2003 panels: Part 2. - Carol Stolicny; Mustapha Slamani; Fidel Muradali; Geir Eide; Mike Li (IEEE Des. Test Comput., 2004)

ITC 2004 panels: Part 1. - Carol Stolicny (IEEE Des. Test Comput., 2005)

ITC 2005 panels. - Carol Stolicny (IEEE Des. Test Comput., 2006)

ITC 2006 panels. - Carol Stolicny (IEEE Des. Test Comput., 2007)