A method for rapid screening of various low-k TDDB models. - Fen Chen; Carole Graas; Michael A. Shinosky; Chad Burke; Kai D. Feng; Craig Bocash; Ramachandran Muralidhar (IRPS, 2015)

Diagnostic electromigration reliability evaluation with a local sensing structure. - Fen Chen; Erik McCullen; Cathryn Christiansen; Michael A. Shinosky; Roger Dufresne; Prakash Periasamy; Rick Kontra; Carole Graas; Gary StOnge (IRPS, 2015)

Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability. - Mukta G. Farooq; Giuseppe La Rosa; Fen Chen; Prakash Periasamy; Troy L. Graves-abe; Chandrasekharan Kothandaraman; C. Collins; W. Landers; J. Oakley; J. Liu; John Safran; S. Ghosh; et al. (IRPS, 2015)

Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges. - Fen Chen; Carole Graas; Michael A. Shinosky; Kai Zhao; Shreesh Narasimha; Xiao Hu Liu; Chunyan Tian (Microelectron. Reliab., 2015)