Comparison of distance mismatch and pair matching of CMOS devices. - Ulrich Schaper; Carsten Linnenbank (ESSCIRC, 2003)

MALTY–A memory test structure for analysis in the early phase of the technology development. - Thomas Nirschl; M. Ostermayr; A. Olbrich; D. Vietzke; M. Omer; Carsten Linnenbank; U. Schaper; Y. Pottgiesser; Jan Pottgiesser; M. Johansson (Microelectron. Reliab., 2003)