Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. - Carsten Wegener; Michael Peter Kennedy (DATE, 2000)

Model-based testing of high-resolution ADCs. - Carsten Wegener; Michael Peter Kennedy (ISCAS, 2000)

Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits. - Carsten Wegener; Michael Peter Kennedy; Bernd Straube (J. Electron. Test., 2001)

Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. - Carsten Wegener; Michael Peter Kennedy (ITC, 2002)

Linear Model-Based Error Identification and Calibration for Data Converters. - Carsten Wegener; Michael Peter Kennedy (DATE, 2003)

Method of reducing contactor effect when testing high-precision ADCs. - Gwenolé Maugard; Carsten Wegener; Tom O'Dwyer; Michael Peter Kennedy (ITC, 2003)

Testing ADCs for static and dynamic INL - killing two birds with one stone. - Carsten Wegener; Michael Peter Kennedy (Comput. Stand. Interfaces, 2004)

Linear model-based testing of ADC nonlinearities. - Carsten Wegener; Michael Peter Kennedy (IEEE Trans. Circuits Syst. I Regul. Pap., 2004)

Innovation to overcome limitations of test equipment. - Carsten Wegener; Michael Peter Kennedy (ECCTD, 2005)

Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. - Carsten Wegener; Michael Peter Kennedy (J. Electron. Test., 2005)

Test Development Through Defect and Test Escape Level Estimation for Data Converters. - Carsten Wegener; Michael Peter Kennedy (J. Electron. Test., 2006)

Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing. - Carsten Wegener; Michael Peter Kennedy (J. Electron. Test., 2007)

An approach to linear model-based testing for nonlinear cascaded mixed-signal systems. - Reik Müller; Carsten Wegener; Hans-Joachim Jentschel; Sebastian Sattler; Heinz Mattes (DATE, 2009)

Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores. - Carsten Wegener; Heinz Mattes; Stéphane Kirmser; Frank Demmerle; Sebastian Sattler (J. Electron. Test., 2009)

Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus. - Esa Korhonen; Carsten Wegener; Juha Kostamovaara (IEEE Trans. Circuits Syst. I Regul. Pap., 2010)

Method of modeling analog circuits in verilog for mixed-signal design simulations. - Carsten Wegener (ECCTD, 2013)

Guest Editorial: Analog, Mixed-Signal and RF Testing. - Gildas Léger; Carsten Wegener (J. Electron. Test., 2016)