GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing. - Alain Bensoussan 002; Ronan Marec; Jean Luc Muraro; L. Portal; Philippe Calvel; Catherine Barillot; Marie Genevieve Perichaud; Laurent Marchand; Gael Vignon (Microelectron. Reliab., 2013)