A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. - Guillaume Hubert; Nadine Buard; Cécile Weulersse; Thierry Carrière; Marie-Catherine Palau; Jean-Marie Palau; Damien Lambert; Jacques Baggio; Frederic Wrobel; Frédéric Saigné; Rémi Gaillard (IOLTS, 2005)

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. - Claudia Rusu; Antonin Bougerol; Lorena Anghel; Cécile Weulersse; Nadine Buard; S. Benhammadi; Nicolas Renaud; Guillaume Hubert; Frederic Wrobel; Thierry Carrière; Rémi Gaillard (IOLTS, 2007)

Test methodology of a new upset mechanism induced by protons in deep sub-micron devices. - Cécile Weulersse; Florent Miller; Dan Alexandrescu; Erwin Schaefer; Olivier Crépel; Rémi Gaillard (Microelectron. Reliab., 2012)

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool. - Cécile Weulersse; Florent Miller; Thierry Carrière; R. Mangeret (Microelectron. Reliab., 2015)