Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test. - Jean-Baptiste Fonder; Laetitia Chevalier; Cédric Genevois; Olivier Latry; Cedric Duperrier; Farid Temcamani; Hichame Maanane (Microelectron. Reliab., 2012)