The detrimental impact of negative Celsius temperature on ultra-low-voltage CMOS logic. - David Bol; Cédric Hocquet; Denis Flandre; Jean-Didier Legat (ESSCIRC, 2010)

Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits. - Dina Kamel; Cédric Hocquet; François-Xavier Standaert; Denis Flandre; David Bol (ESSCIRC, 2010)

Robustness-aware sleep transistor engineering for power-gated nanometer subthreshold circuits. - David Bol; Cédric Hocquet; Denis Flandre; Jean-Didier Legat (ISCAS, 2010)

Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold Devices through an Example of a 65nm AES Implementation. - Alessandro Barenghi; Cédric Hocquet; David Bol; François-Xavier Standaert; Francesco Regazzoni 001; Israel Koren (RFIDSec, 2011)

Harvesting the potential of nano-CMOS for lightweight cryptography: an ultra-low-voltage 65 nm AES coprocessor for passive RFID tags. - Cédric Hocquet; Dina Kamel; Francesco Regazzoni 001; Jean-Didier Legat; Denis Flandre; David Bol; François-Xavier Standaert (J. Cryptogr. Eng., 2011)

Towards Green Cryptography: A Comparison of Lightweight Ciphers from the Energy Viewpoint. - Stéphanie Kerckhof; François Durvaux; Cédric Hocquet; David Bol; François-Xavier Standaert (CHES, 2012)

A 25MHz 7μW/MHz ultra-low-voltage microcontroller SoC in 65nm LP/GP CMOS for low-carbon wireless sensor nodes. - David Bol; Julien De Vos; Cédric Hocquet; François Botman; François Durvaux; Sarah Boyd; Denis Flandre; Jean-Didier Legat (ISSCC, 2012)

A Fast ULV Logic Synthesis Flow in Many-Vt CMOS Processes for Minimum Energy Under Timing Constraints. - David Bol; Cédric Hocquet; Francesco Regazzoni 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2012)

SleepWalker: A 25-MHz 0.4-V Sub-mm2 7-µW/MHz Microcontroller in 65-nm LP/GP CMOS for Low-Carbon Wireless Sensor Nodes. - David Bol; Julien De Vos; Cédric Hocquet; François Botman; François Durvaux; Sarah Boyd; Denis Flandre; Jean-Didier Legat (IEEE J. Solid State Circuits, 2013)

A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks. - Alessandro Barenghi; Cédric Hocquet; David Bol; François-Xavier Standaert; Francesco Regazzoni 001; Israel Koren (IEEE Trans. Emerg. Top. Comput., 2014)