Advanced Statistical Methodology for 6T-SRAM Design. - Cédric Maufront; Richard Ferrant (ICECS, 2007)

Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing. - Étienne Le Quéré; Stéphane Dauzère-Pérès; Karim Tamssaouet; Cédric Maufront; Stéphane Astie (WSC, 2020)