A frequency measurement BIST implementation targeting gigahertz application. - Matthieu Dubois; Emeric de Foucauld; Christopher Mounet; Serigne Dia; Cedric Mayor (ITC, 2012)

Cost-driven statistical analysis for selection of alternative measurements of analog circuits. - Matthieu Verdy; Alin Ratiu; Dominique Morche; Emeric de Foucauld; Suzanne Lesecq; Jean-Pascal Mallet; Cedric Mayor (ICECS, 2014)

Balancing test cost reduction vs. measurements accuracy at test time. - Matthieu Verdy; Dominique Morche; Emeric de Foucauld; Suzanne Lesecq; Jean-Pascal Mallet; Cedric Mayor (NEWCAS, 2015)

IoT: Source of test challenges. - Erik Jan Marinissen; Yervant Zorian; Mario Konijnenburg; Chih-Tsun Huang; Ping-Hsuan Hsieh; Peter Cockburn; Jeroen Delvaux; Vladimir Rozic; Bohan Yang 001; Dave Singelée; Ingrid Verbauwhede; Cedric Mayor; et al. (ETS, 2016)