Hot carrier effect on the bipolar transistors' response to electromagnetic interference. - Cen Xiong; Shuhuan Liu; Yonghong Li; Du Tang; Jinxin Zhang; Xuecheng Du; Chaohui He (Microelectron. Reliab., 2015)

Hot carrier effect on a single SiGe HBT's EMI response. - Cen Xiong; Yonghong Li; Shuhuan Liu; Du Tang; Jinxin Zhang; Chaohui He (Microelectron. Reliab., 2015)

3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment. - Jinxin Zhang; Chaohui He; Hongxia Guo; Du Tang; Cen Xiong; Pei Li; Xin Wang 141 (Microelectron. Reliab., 2015)

Time dependent modeling of single particle displacement damage in silicon devices. - Du Tang; Ignacio Martin-Bragado; Chaohui He; Hang Zang; Cen Xiong; Yonghong Li; Daxi Guo; Peng Zhang; Jinxin Zhang (Microelectron. Reliab., 2016)