From an analytic NBTI device model to reliability assessment of complex digital circuits. - Nasim Pour Aryan; A. Listl; Leonhard Heiß; Cenk Yilmaz; Georg Georgakos; Doris Schmitt-Landsiedel (IOLTS, 2014)

In situ measurement of aging-induced performance degradation in digital circuits. - Nasim Pour Aryan; Christian Funke; Jens Bargfrede; Cenk Yilmaz; Doris Schmitt-Landsiedel; Georg Georgakos (ETS, 2016)