Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. - Cezary Sydlo; Bastian Mottet; Husin Ganis; Hans L. Hartnagel; Viktor Krozer; Sylvain L. Delage; Simone Cassette; Eric Chartier; D. Floriot; Steven Bland (Microelectron. Reliab., 2001)

Reliability investigations on HBV using pulsed electrical stress. - Cezary Sydlo; M. Saglam; Bastian Mottet; Manuel Rodríguez-Gironés; Hans L. Hartnagel (Microelectron. Reliab., 2002)

Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress. - Cezary Sydlo; Kabula Mutamba; L. Divac Krnic; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2003)

Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning. - Cezary Sydlo; Jochen Sigmund; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2005)

Low-Temperature Grown GaAsSb with Sub-Picosecond Photocarrier Lifetime for Continuous-Wave Terahertz Measurements. - Jochen Sigmund; Jean-François Lampin; Valentin Ivannikov; Cezary Sydlo; Michail Feiginov; Dimitris Pavlidis; Peter Meissner; Hans L. Hartnagel (IEICE Trans. Electron., 2008)