Insertion of Ag Layer in TiN/SiNx/TiN RRAM and Its Effect on Filament Formation Modeled by Monte Carlo Simulation. - Yeon-Joon Choi; Min-Hwi Kim; Suhyun Bang; Tae-Hyeon Kim; Dong Keun Lee; Kyungho Hong; Chae Soo Kim; Sungjun Kim; Seongjae Cho; Byung-Gook Park (IEEE Access, 2020)