Intelligent Manufacturing: TCAD-Assisted Adaptive Weighting Neural Networks. - Chien Y. Huang; Sze Ming Fu; Parag Parashar; Chun Han Chen; Chandni Akbar; Albert S. Lin (IEEE Access, 2018)

Physics-Prior Bayesian Neural Networks in Semiconductor Processing. - Chun Han Chen; Parag Parashar; Chandni Akbar; Sze Ming Fu; Ming-Ying Syu; Albert Lin 001 (IEEE Access, 2019)

Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs. - Chandni Akbar; Yiming Li 005; Wen-Li Sung (IEEE Access, 2021)

Device-Simulation-Based Machine Learning Technique for the Characteristic of Line Tunnel Field-Effect Transistors. - Chandni Akbar; Yiming Li 005; Narasimhulu Thoti (IEEE Access, 2022)

Transfer learning approach to analyzing the work function fluctuation of gate-all-around silicon nanofin field-effect transistors. - Chandni Akbar; Yiming Li 005; Wen-Li Sung (Comput. Electr. Eng., 2022)

Application of long short-term memory modeling technique to predict process variation effects of stacked gate-all-around Si nanosheet complementary-field effect transistors. - Rajat Butola; Yiming Li 005; Sekhar Reddy Kola; Chandni Akbar; Min-Hui Chuang (Comput. Electr. Eng., 2023)