A 7Gb/s/pin GDDR5 SDRAM with 2.5ns bank-to-bank active time and no bank-group restriction. - Tae-Young Oh; Young-Soo Sohn; Seung-Jun Bae; Min-Sang Park; Ji-Hoon Lim; Yong-Ki Cho; Dae-Hyun Kim 003; Dong-Min Kim; Hye-Ran Kim; Hyun-Joong Kim; Jin-Hyun Kim; Jin-Kook Kim; et al. (ISSCC, 2010)

A 40nm 2Gb 7Gb/s/pin GDDR5 SDRAM with a programmable DQ ordering crosstalk equalizer and adjustable clock-tracking BW. - Seung-Jun Bae; Young-Soo Sohn; Tae-Young Oh; Si-Hong Kim; Yun-Seok Yang; Dae-Hyun Kim 003; Sang-Hyup Kwak; Ho-Seok Seol; Chang-Ho Shin; Min-Sang Park; Gong-Heom Han; Byeong-Cheol Kim; et al. (ISSCC, 2011)

A 7 Gb/s/pin 1 Gbit GDDR5 SDRAM With 2.5 ns Bank to Bank Active Time and No Bank Group Restriction. - Tae-Young Oh; Young-Soo Sohn; Seung-Jun Bae; Min-Sang Park; Ji-Hoon Lim; Yong-Ki Cho; Dae-Hyun Kim 003; Dong-Min Kim; Hye-Ran Kim; Hyun-Joong Kim; Jin-Hyun Kim; Jin-Kook Kim; et al. (IEEE J. Solid State Circuits, 2011)

25.1 A 3.2Gb/s/pin 8Gb 1.0V LPDDR4 SDRAM with integrated ECC engine for sub-1V DRAM core operation. - Tae-Young Oh; Hoeju Chung; Young-Chul Cho; Jang-Woo Ryu; Kiwon Lee; Changyoung Lee; Jin-Il Lee; Hyoung-Joo Kim 002; Min-Soo Jang; Gong-Heum Han; Kihan Kim; Daesik Moon; et al. (ISSCC, 2014)

18.1 A 20nm 9Gb/s/pin 8Gb GDDR5 DRAM with an NBTI monitor, jitter reduction techniques and improved power distribution. - Hye-Yoon Joo; Seung-Jun Bae; Young-Soo Sohn; Young-Sik Kim; Kyung-Soo Ha; Min-Su Ahn; Young-Ju Kim 001; Yong-Jun Kim; Ju-Hwan Kim; Won-Jun Choi; Chang-Ho Shin; Soo Hwan Kim; et al. (ISSCC, 2016)

A 16Gb LPDDR4X SDRAM with an NBTI-tolerant circuit solution, an SWD PMOS GIDL reduction technique, an adaptive gear-down scheme and a metastable-free DQS aligner in a 10nm class DRAM process. - Ki Chul Chun; Yonggyu Chu; Jin-Seok Heo; Tae-Sung Kim; Soohwan Kim; Hui-Kap Yang; Mi-Jo Kim; Chang-Kyo Lee; Ju-Hwan Kim; Hyunchul Yoon; Chang-Ho Shin; Sang-uhn Cha; et al. (ISSCC, 2018)

A 16Gb 18Gb/S/pin GDDR6 DRAM with per-bit trainable single-ended DFE and PLL-less clocking. - Young-Ju Kim 001; Hye-Jung Kwon; Su-Yeon Doo; Yoon-Joo Eom; Young-Sik Kim; Min-Su Ahn; Yong-Hun Kim; Sang-Hoon Jung; Sung-Geun Do; Chang-Yong Lee; Jae-Sung Kim; Dong-Seok Kang; et al. (ISSCC, 2018)

A 16-Gb, 18-Gb/s/pin GDDR6 DRAM With Per-Bit Trainable Single-Ended DFE and PLL-Less Clocking. - Young-Ju Kim 001; Hye-Jung Kwon; Su-Yeon Doo; Min-Su Ahn; Yong-Hun Kim; Yong Jae Lee; Dong-Seok Kang; Sung-Geun Do; Chang-Yong Lee; Gun-hee Cho; Jae-Koo Park; Jae-Sung Kim; et al. (IEEE J. Solid State Circuits, 2019)

22.2 An 8.5Gb/s/pin 12Gb-LPDDR5 SDRAM with a Hybrid-Bank Architecture using Skew-Tolerant, Low-Power and Speed-Boosting Techniques in a 2nd generation 10nm DRAM Process. - Hyung-Joon Chi; Chang-Kyo Lee; Junghwan Park; Jin-Seok Heo; Jaehoon Jung; Dongkeon Lee; Dae-Hyun Kim 003; Dukha Park; Kihan Kim; Sang-Yun Kim 001; Jinsol Park; Hyunyoon Cho; et al. (ISSCC, 2020)

Detecting abnormal behavior of automatic test equipment using autoencoder with event log data. - Young-Mok Bae; Young-Gwan Kim; Jeong-Woo Seo; Hyun-A Kim; Chang-Ho Shin; Jeong-Hwan Son; Gyu-Ho Lee; Kwang-Jae Kim (Comput. Ind. Eng., 2023)