Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology. - Ming-Hung Weng; Chao-Hung Chen; Che-Kai Lin; Shih-Hui Huang; Jhih-Han Du; Sheng-Wen Peng; Walter Wohlmuth; Frank Yung-Shi Chou; Chang-Hwang Hua (Microelectron. Reliab., 2014)