Synthesis of workload monitors for on-line stress prediction. - Rafal Baranowski; Alejandro Cook; Michael E. Imhof; Chang Liu 010; Hans-Joachim Wunderlich (DFTS, 2013)

FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. - Sybille Hellebrand; Thomas Indlekofer; Matthias Kampmann; Michael A. Kochte; Chang Liu 010; Hans-Joachim Wunderlich (ITC, 2014)

On-line prediction of NBTI-induced aging rates. - Rafal Baranowski; Farshad Firouzi; Saman Kiamehr; Chang Liu 010; Mehdi Baradaran Tahoori; Hans-Joachim Wunderlich (DATE, 2015)

Efficient observation point selection for aging monitoring. - Chang Liu 010; Michael A. Kochte; Hans-Joachim Wunderlich (IOLTS, 2015)

Aging monitor reuse for small delay fault testing. - Chang Liu 010; Michael A. Kochte; Hans-Joachim Wunderlich (VTS, 2017)

Improvement of hardware reliability with aging monitors. - Chang Liu 010 (2017)

Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. - Chang Liu 010; Eric Schneider; Matthias Kampmann; Sybille Hellebrand; Hans-Joachim Wunderlich (ATS, 2018)

Built-In Test for Hidden Delay Faults. - Matthias Kampmann; Michael A. Kochte; Chang Liu 010; Eric Schneider; Sybille Hellebrand; Hans-Joachim Wunderlich (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

Using Programmable Delay Monitors for Wear-Out and Early Life Failure Prediction. - Chang Liu 010; Eric Schneider; Hans-Joachim Wunderlich (DATE, 2020)