Evaluating the abrasive wear of Zn1-xMnxO heteroepitaxial layers using a nanoscratch technique. - Yu-Ming Chang; Hua-Chiang Wen; Chu-Shou Yang; Derming Lian; Chien-Huang Tsai; Jyh-Shyang Wang; Wen-Fa Wu; Chang-Pin Chou (Microelectron. Reliab., 2010)

Evaluation of the nanoindentation behaviors of SiGe epitaxial layer on Si substrate. - Bo-Ching He; Chun-Hu Cheng; Hua-Chiang Wen; Yi-Shao Lai; Ping-Feng Yang; Meng-Hung Lin; Wen-Fa Wu; Chang-Pin Chou (Microelectron. Reliab., 2010)

Effect of annealing treatment and nanomechanical properties for multilayer Si0.8Ge0.2-Si films. - Bo-Ching He; Hua-Chiang Wen; Meng-Hung Lin; Yi-Shao Lai; Wen-Fa Wu; Chang-Pin Chou (Microelectron. Reliab., 2010)

Investigation of Profile Cutting on Glass Plates Using a Pulsed UV Laser System. - Shih-Feng Tseng; Wen-Tse Hsiao; Kuo-Cheng Huang; Chien-Yao Huang; Chang-Pin Chou (Int. J. Autom. Technol., 2011)

Evaluating nanotribological behavior of annealing Si0.8Ge0.2/Si films. - Ming-Jhang Wu; Hua-Chiang Wen; Shyh-Chi Wu; Ping-Feng Yang; Yi-Shao Lai; Wen-Kuang Hsu; Wen-Fa Wu; Chang-Pin Chou (Microelectron. Reliab., 2011)