Cost-Optimized Double-Node-Upset-Recovery Latch Designs With Aging Mitigation and Algorithm-Based Verification for Long-Term Robustness Enhancement. - Aibin Yan; Changli Hu; Jing Li; Na Bai; Zhengfeng Huang; Tianming Ni; Patrick Girard 001; Xiaoqing Wen (IEEE Trans. Very Large Scale Integr. Syst., 2025)