Electret: An Entirely New Approach of Solving Partial Discharge Caused by Triple Points, Sharp Edges, Bubbles, and Airgaps. - Chanyeop Park (IEEE Access, 2020)

Static and Dynamic Characterization of 1200 V SiC MOSFETs at Room and Cryogenic Temperatures. - Mahmoud Mehrabankhomartash; Shiyuan Yin; Alfonso J. Cruz; Lukas Graber; Maryam Saeedifard; Simon Evans; Florian Kapaun; Ivan Revel; Gerhard Steiner; Ludovic Ybanez; Chanyeop Park (IECON, 2021)

Electrets: A Remedy for Partial Discharge Caused by Power Electronics Switching. - Chanyeop Park (IEEE Trans. Ind. Electron., 2021)

Effects of Fabrication Conditions on the Partial Discharge Mitigation Performance of Electrets for Power Electronic Driven Systems. - Farhina Haque; Omar Faruqe; Chanyeop Park (IEEE Trans. Ind. Electron., 2023)