Electrical and Physical Characteristics of WO3/Ag/WO3 Sandwich Structure Fabricated with Magnetic-Control Sputtering Metrology †. - Shea-Jue Wang; Mu-Chun Wang; Shih-Fan Chen; Yu-Hsiang Li; Tien-Szu Shen; Hui-Yun Bor; Chao-Nan Wei (Sensors, 2018)

Patterns of Exposing Integrity of 28nm-node High-k Gate Dielectric on p-substrate with Nitridation Treatments. - Si-Ping Li; Jia-Wei Xu; Wei-Hao Li; Jian-Ming Chen; Chao-Nan Wei; Wen-How Lan; Mu-Chun Wang (ICKII, 2020)