Potential of Eddy Current Pulsed Thermography as a Nondestructive Testing Method. - Yiping Liang; Libing Bai; Xu Zhang 055; Chao Ren 008; Yuhua Cheng 001 (IEEE Instrum. Meas. Mag., 2022)

Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image. - Yiping Liang; Libing Bai; Lulu Tian; Xu Zhang 055; Chao Ren 008; Dan Shao; Zhenzhong Ma; Mosi Sun (IEEE Trans. Ind. Informatics, 2024)

Surface Defect 3-D Profile Reconstruction Using Eddy Current Pulsed Thermography. - Xu Zhang 055; Libing Bai; Yiping Liang; Jinsheng Yang; Jiangshan Ai; Chao Ren 008 (IEEE Trans. Ind. Informatics, 2024)