Over-Voltage Protection on the CC Pin of USB Type-C Interface against Electrical Overstress Events. - Chao-Yang Ke; Ming-Dou Ker (IRPS, 2020)

Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFET with TLP and UIS Test Methods. - Chao-Yang Ke; Yu-Chia Tsui; Bing-Yue Tsui; Ming-Dou Ker (IRPS, 2023)