Electrical Contact Resistance of Contact Bodies With Cambered Surface. - Wanbin Ren; Chao Zhang 044; Xilai Sun (IEEE Access, 2020)

In Situ Optical Observation of Nanoscale Contact Spots Evolution Under Normal Loading. - Chao Zhang 044; Wanbin Ren; Zhe Zheng; Xiujie Liu; Jian Liu (IEEE Trans. Instrum. Meas., 2024)

In Situ Interface Characterization of Arcing Electrode Materials and Evolution in Electrical Endurance Experiments. - Zhe Zheng; Wanbin Ren; Chao Zhang 044 (IEEE Trans. Instrum. Meas., 2024)