Hot carrier effect on the bipolar transistors' response to electromagnetic interference. - Cen Xiong; Shuhuan Liu; Yonghong Li; Du Tang; Jinxin Zhang; Xuecheng Du; Chaohui He (Microelectron. Reliab., 2015)

Hot carrier effect on a single SiGe HBT's EMI response. - Cen Xiong; Yonghong Li; Shuhuan Liu; Du Tang; Jinxin Zhang; Chaohui He (Microelectron. Reliab., 2015)

3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment. - Jinxin Zhang; Chaohui He; Hongxia Guo; Du Tang; Cen Xiong; Pei Li; Xin Wang 141 (Microelectron. Reliab., 2015)

Time dependent modeling of single particle displacement damage in silicon devices. - Du Tang; Ignacio Martin-Bragado; Chaohui He; Hang Zang; Cen Xiong; Yonghong Li; Daxi Guo; Peng Zhang; Jinxin Zhang (Microelectron. Reliab., 2016)

Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor. - Jinxin Zhang; Hongxia Guo; Fengqi Zhang; Chaohui He; Pei Li; Yunyi Yan; Hui Wang; Linxia Zhang (Sci. China Inf. Sci., 2017)

Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip. - Xuecheng Du; Shuhuan Liu; Dongyang Luo; Yao Zhang; Xiaozhi Du; Chaohui He; Xiaotang Ren; Weitao Yang; Yuan Yuan (Microelectron. Reliab., 2017)

A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error. - Xiaozhi Du; Dongyang Luo; Chaohui He; Shuhuan Liu (J. Electron. Test., 2018)

FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC. - Xiaozhi Du; Dongyang Luo; Kailun Shi; Chaohui He; Shuhuan Liu (J. Electron. Test., 2018)

Investigation of enhanced low dose rate sensitivity in SiGe HBTs by 60Co γ irradiation under different biases. - Jinxin Zhang; Qi Guo 007; Hongxia Guo; Wu Lu; Chaohui He; Xin Wang 141; Pei Li; Lin Wen (Microelectron. Reliab., 2018)

Single-event multiple transients in guard-ring hardened inverter chains of different layout designs. - Wen Zhao; Chaohui He; Wei Chen; Rongmei Chen; Peitian Cong; Fengqi Zhang; Zujun Wang; Chen Shen; Lisang Zheng; Xiaoqiang Guo; Lili Ding (Microelectron. Reliab., 2018)