Impact of Passivation Layers on Irradiation Response of PNP Transistors Under Different Dose Rates. - Xingji Li; Lei Dong; Jianqun Yang; Chaoming Liu (IEEE Access, 2017)

Simulation study of single event effects in the SiC LDMOS with a step compound drift region. - Mengtian Bao; Ying Wang 041; Xingji Li; Chaoming Liu; Cheng-Hao Yu; Fei Cao (Microelectron. Reliab., 2018)

Synergistic effects of NPN transistors caused by combined proton irradiations with different energies. - Xingji Li; Jianqun Yang; Chaoming Liu; Gang Bai; Wenbo Luo; Pengwei Li (Microelectron. Reliab., 2018)

The effect of ionization and displacement damage on minority carrier lifetime. - Jianqun Yang; Xingji Li; Chaoming Liu; Daniel M. Fleetwood (Microelectron. Reliab., 2018)

Learning Multimodal Word Representations by Explicitly Embedding Syntactic and Phonetic Information. - Wenhao Zhu; Shuang Liu; Chaoming Liu; Xiaoya Yin; Xiaping Xu (IEEE Access, 2020)

Incorporating Syntactic and Phonetic Information into Multimodal Word Embeddings Using Graph Convolutional Networks. - Wenhao Zhu; Shuang Liu; Chaoming Liu (ICASSP, 2021)

Design of a high-performance 12T SRAM cell for single event upset tolerance. - Chunhua Qi; Yanqing Zhang 012; Guoliang Ma; Chaoming Liu; Tianqi Wang; Liyi Xiao; Mingxue Huo; Guofu Zhai (Sci. China Inf. Sci., 2021)

Learning multimodal word representation with graph convolutional networks. - Wenhao Zhu; Shuang Liu; Chaoming Liu (Inf. Process. Manag., 2021)

Exploiting Syntactic Information to Boost the Fine-tuning of Pre-trained Models. - Chaoming Liu; Wenhao Zhu; Xiaoyu Zhang; Qiuhong Zhai (COMPSAC, 2022)

SIFTER: A Task-specific Alignment Strategy for Enhancing Sentence Embeddings. - Chao Yu; Wenhao Zhu; Chaoming Liu; Xiaoyu Zhang; Qiuhong Zhai (CoRR, 2023)

LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy. - Hui Xu; Jing Zhou; Ruijun Ma; Huaguo Liang; Zhengfeng Huang; Chaoming Liu (Integr., 2023)

Design of novel low cost triple-node-upset self-recoverable hardened latch. - Hui Xu; Shuo Zhu; Ruijun Ma; Zhengfeng Huang; Huaguo Liang; Haojie Sun; Chaoming Liu (Integr., 2024)

Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments. - Hui Xu; Chaoming Liu; Ruijun Ma; Tai Song; Zhengfeng Huang; Jun Wang; Xuewei Qin; Yu Xia (Microelectron. J., 2024)

A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches. - Hui Xu; Xuewei Qin; Ruijun Ma; Chaoming Liu; Shuo Zhu; Jun Wang; Huaguo Liang (J. Electron. Test., 2024)