A scan BIST generation method using a markov source and partial bit-fixing. - Wei Li 023; Chaowen Yu; Sudhakar M. Reddy; Irith Pomeranz (DAC, 2003)

An Improved Markov Source Design for Scan BIST. - Chaowen Yu; Wei Li 023; Sudhakar M. Reddy; Irith Pomeranz (IOLTS, 2003)

Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults. - Chaowen Yu; Sudhakar M. Reddy; Irith Pomeranz (Asian Test Symposium, 2004)

Circuit Independent Weighted Pseudo-Random BIST Pattern Generator. - Chaowen Yu; Sudhakar M. Reddy; Irith Pomeranz (Asian Test Symposium, 2005)

A Partitioning Technique for Identification of Error-Capturing Scan Cells in Scan-BIST. - Chaowen Yu; Sudhakar M. Reddy; Irith Pomeranz (IOLTS, 2006)