Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation. - Wenjuan Mei; Chaowu Pan; Zhen Liu 003; Yuanzhang Su; Yusong Mei; Qi Zhou (I2MTC, 2023)

Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses. - Wenjuan Mei; Zhen Liu 003; Chaowu Pan; Ouhang Li; Yuanzhang Su; Qi Zhou (IEEE Trans. Instrum. Meas., 2023)