Characterization of the transient behavior of gated/STI diodes and their associated BJT in the CDM time domain. - Jean-Robert Manouvrier; Pascal Fonteneau; Charles-Alexandre Legrand; Pascal Nouet; Florence Azaïs (Microelectron. Reliab., 2009)

Novel back-biased UTBB lateral SCR for FDSOI ESD protections. - Yohann Solaro; Pascal Fonteneau; Charles-Alexandre Legrand; Claire Fenouillet-Béranger; Philippe Ferrari; Sorin Cristoloveanu (ESSDERC, 2013)