Charge-out system for management acceptance and control of the computer resource. - Richard L. Nolan; Charles Carey; Michael J. Samek; K. Sreenivasan; John V. Soden; Myron Uretsky (AFIPS National Computer Conference, 1974)

CPI Reliability Challenges of Large Flip Chip Packages and Effects of Kerf Size and Substrate. - Zhuo-Jie Wu; Manish Nayini; Charles Carey; Samantha Donovan; David Questad; Edmund D. Blackshear (IRPS, 2019)