A Study of Generation-Annealing - Charging of Oxide and Interface Traps in Metal-Oxide - Semiconductor Structure Using Tunneling and Hot Electron Injections - Charles Ching-Hsiang Hsu (1988)

Flash Memories. - Rick Shih-Jye Shen; Frank Ruei-Ling Lin; Amy Hsiu-Fen Chou; Evans Ching-Song Yang; Charles Ching-Hsiang Hsu (The VLSI Handbook, 1999)

Embedded OTP fuse in CMOS logic process. - Ching-Yuan Lin; Chung-Hung Lin; Chien-Hung Ho; Wei-Wu Liao; Shu-Yueh Lee; Ming-Chou Ho; Shih-Chen Wang; Shih-Chan Huang; Yuan-Tai Lin; Charles Ching-Hsiang Hsu (MTDT, 2005)

Logic Non-Volatile Memory - The NVM Solutions from eMemory - Charles Ching-Hsiang Hsu; Yuan-Tai Lin; Evans Ching-Song Yang; Rick Shih-Jye Shen (World Scientific, 2014)