Enumeration of Strongly Connected Sequential Machines - Charles E. Radke (Inf. Control., 1965)

Merge-Sort Analysis by Matrix Techniques. - Charles E. Radke (IBM Syst. J., 1966)

Necessary and Sufficient Conditions on Conditional Probabilities to Maximize Entropy - Charles E. Radke (Inf. Control., 1966)

A justification of, and an improvement on, a useful rule for predicting circuit-to-pin ratios. - Charles E. Radke (DAC, 1969)

The use of quadratic residue research. - Charles E. Radke (Commun. ACM, 1970)

Do Stuck Fault Models Reflect Manufacturing Defects? - C. C. Beh; K. H. Arya; Charles E. Radke; E. Kofi Vida-Torku (ITC, 1982)

Quality level and fault coverage for multichip modules. - E. Kofi Vida-Torku; Charles E. Radke (DAC, 1983)

Improve Yield and Quality Through Testability Analysis of VLSI Circuits. - David M. Wu; Charles E. Radke; C. C. Beh (ITC, 1984)

Performance Assurance of Memories Embedded in VLSI Chips. - E. Kofi Vida-Torku; James A. Monzel; Charles E. Radke (ITC, 1986)

Statistical AC Test Coverage. - David M. Wu; Charles E. Radke; J. Paul Roth (ITC, 1986)

Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. - David M. Wu; Charles E. Radke (DAC, 1991)