Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. - Jerry M. Soden; Charles F. Hawkins (ITC, 1985)

Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. - Jerry M. Soden; Charles F. Hawkins (ITC, 1986)

Test Considerations for Gate Oxide Shorts in CMOS ICs. - Jerry M. Soden; Charles F. Hawkins (IEEE Des. Test, 1986)

CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. - Jerry M. Soden; R. Keith Treece; Michael R. Taylor; Charles F. Hawkins (ITC, 1989)

Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. - Ronald R. Fritzemeier; Jerry M. Soden; R. Keith Treece; Charles F. Hawkins (ITC, 1990)

Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ. - Jerry M. Soden; Ronald R. Fritzemeier; Charles F. Hawkins (ITC, 1990)

Errors in testing. - Richard H. Williams; Charles F. Hawkins (ITC, 1990)

EE Curriculum - Continuous Process Improvement? - Charles F. Hawkins; Richard H. Williams (ITC, 1991)

The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. - Christopher L. Henderson; Jerry M. Soden; Charles F. Hawkins (ITC, 1991)

System Testing: The Future for All of Us. - Charles F. Hawkins (ITC, 1992)

Economic Impact of Type I Test Errors at System and Board Levels. - Christopher L. Henderson; Richard H. Williams; Charles F. Hawkins (ITC, 1992)

Testing Errors: Data and Calculations in an IC Manufacturing Process. - Richard H. Williams; R. Glenn Wagner; Charles F. Hawkins (ITC, 1992)

Introduction. - Ravi K. Gulati; Charles F. Hawkins (J. Electron. Test., 1992)

IDDQ testing: A review. - Jerry M. Soden; Charles F. Hawkins; Ravi K. Gulati; Weiwei Mao (J. Electron. Test., 1992)

Quality Testing Requires Quality Thinking. - Jerry M. Soden; Charles F. Hawkins (ITC, 1993)

A General Purpose IDDQ Measurement Circuit. - Kenneth M. Wallquist; Alan W. Righter; Charles F. Hawkins (ITC, 1993)

The Economics of Guardband Placement. - Richard H. Williams; Charles F. Hawkins (ITC, 1993)

Defect Classes - An Overdue Paradigm for CMOS IC. - Charles F. Hawkins; Jerry M. Soden; Alan W. Righter; F. Joel Ferguson (ITC, 1994)

A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. - Jaume Segura 001; Carol de Benito; Antonio Rubio 001; Charles F. Hawkins (ITC, 1995)

IDDQ Design and Test Advantages Propel Industry. - Charles F. Hawkins; Jerry M. Soden (IEEE Des. Test Comput., 1995)

IDDQ Testing: Issues Present and Future. - Jerry M. Soden; Charles F. Hawkins (IEEE Des. Test Comput., 1996)

A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors. - Jaume Segura 001; Carol de Benito; Antonio Rubio 001; Charles F. Hawkins (J. Electron. Test., 1996)

Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. - Edward I. Cole Jr.; Jerry M. Soden; Paiboon Tangyunyong; Patrick L. Candelaria; Richard W. Beegle; Daniel L. Barton; Christopher L. Henderson; Charles F. Hawkins (ITC, 1997)

Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs. - Ali Keshavarzi; Kaushik Roy 001; Charles F. Hawkins (ITC, 1997)

CMOS IC reliability indicators and burn-in economics. - Alan W. Righter; Charles F. Hawkins; Jerry M. Soden; Peter C. Maxwell (ITC, 1998)

Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's. - Ali Keshavarzi; Siva G. Narendra; Shekhar Borkar; Charles F. Hawkins; Kaushik Roy 001; Vivek De (ISLPED, 1999)

Test and Reliability: Partners in IC Manufacturing, Part 1. - Charles F. Hawkins; Jaume Segura 001 (IEEE Des. Test Comput., 1999)

Deep Submicron CMOS Current IC Testing: Is There a Future? - Charles F. Hawkins; Jerry M. Soden (IEEE Des. Test Comput., 1999)

Test and Reliability: Partners in IC Manufacturing, Part 2. - Charles F. Hawkins; Jaume Segura 001; Jerry M. Soden; Ted Dellin (IEEE Des. Test Comput., 1999)

Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. - Ali Keshavarzi; Kaushik Roy 001; Charles F. Hawkins; Manoj Sachdev; Krishnamurthy Soumyanath; Vivek De (ITC, 2000)

Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions. - Ali Keshavarzi; Kaushik Roy 001; Charles F. Hawkins (IEEE Trans. Very Large Scale Integr. Syst., 2000)

Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. - Ivan de Paúl; M. Rosales; Bartomeu Alorda; Jaume Segura 001; Charles F. Hawkins; Jerry M. Soden (VTS, 2001)

Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. - Bartomeu Alorda; M. Rosales; Jerry M. Soden; Charles F. Hawkins; Jaume Segura 001 (ITC, 2002)

GHz Testing and Its Fuzzy Targets. - Chuck Hawkins; Jaume Segura 001 (ITC, 2002)

Parametric Failures in CMOS ICs - A Defect-Based Analysis. - Jaume Segura 001; Ali Keshavarzi; Jerry M. Soden; Charles F. Hawkins (ITC, 2002)

Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. - Ali Keshavarzi; James W. Tschanz; Siva G. Narendra; Vivek De; W. Robert Daasch; Kaushik Roy 001; Manoj Sachdev; Charles F. Hawkins (IEEE Des. Test Comput., 2002)

CMOS IC nanometer technology failure mechanisms. - Charles F. Hawkins; Ali Keshavarzi; Jaume Segura 001 (CICC, 2003)

A View from the Bottom: Nanometer Technology AC Parametric Failures – Why, Where, and How to Detect. - Charles F. Hawkins; Ali Keshavarzi; Jaume Segura 001 (DFT, 2003)

Burn-in Temperature Projections for Deep Sub-micron Technologies. - Oleg Semenov; Arman Vassighi; Manoj Sachdev; Ali Keshavarzi; Charles F. Hawkins (ITC, 2003)

Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. - Ali Keshavarzi; Kaushik Roy 001; Charles F. Hawkins; Vivek De (IEEE Trans. Very Large Scale Integr. Syst., 2003)

The anatomy of nanometer timing failures. - Chuck Hawkins; Jaume Segura 001 (ETS, 2005)

Parametric Failures and Detection Strategies. - Chuck Hawkins (LATW, 2006)

A modern look at the CMOS stuck-open fault. - Roberto Gómez 001; Víctor H. Champac; Chuck Hawkins; Jaume Segura 001 (LATW, 2009)

Stuck-Open Fault Leakage and Testing in Nanometer Technologies. - Julio César Vázquez; Víctor H. Champac; Chuck Hawkins; Jaume Segura 001 (VTS, 2009)

Reliability analysis of small delay defects in vias located in signal paths. - Hector Villacorta; Víctor H. Champac; Chuck Hawkins; Jaume Segura 001 (LATW, 2010)

Testing of Stuck-Open Faults in Nanometer Technologies. - Víctor H. Champac; Julio Vazquez Hernandez; Salvador Barceló; Roberto Gómez 001; Chuck Hawkins; Jaume Segura 001 (IEEE Des. Test Comput., 2012)

Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. - Hector Villacorta; Charles F. Hawkins; Víctor H. Champac; Jaume Segura 001; Roberto Gómez 001 (IEEE Des. Test, 2013)