Detection of an antenna effect in VLSI designs. - Wojciech Maly; Charles H. Ouyang; Subhendra Ghosh; Sury Maturi (DFT, 1996)

Extraction of critical areas for opens in large VLSI circuits. - Charles H. Ouyang; Witold A. Pleskacz; Wojciech Maly (DFT, 1996)

CAD at the Design-Manufacturing Interface. - Hans T. Heineken; Jitendra Khare; Wojciech Maly; Pranab K. Nag; Charles H. Ouyang; Witold A. Pleskacz (DAC, 1997)

Design-Manufacturing Interface: Part II - Applications. - Wojciech Maly; Pranab K. Nag; Charles H. Ouyang; Hans T. Heineken; Jitendra Khare; P. Simon (DATE, 1998)

A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits. - Witold A. Pleskacz; Charles H. Ouyang; Wojciech Maly (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

Maximizing Wafer Productivity Through Layout Optimization. - Charles H. Ouyang; Hans T. Heineken; Jitendra Khare; Saghir A. Shaikh; Manuel d'Abreu (VLSI Design, 2000)