Field testing for cosmic ray soft errors in semiconductor memories. - Timothy J. O'Gorman; Joseph M. Ross; Allen H. Taber; James F. Ziegler; Hans P. Muhlfeld; Charles J. Montrose; Huntington W. Curtis; James L. Walsh (IBM J. Res. Dev., 1996)

IBM experiments in soft fails in computer electronics (1978-1994). - James F. Ziegler; Huntington W. Curtis; Hans P. Muhlfeld; Charles J. Montrose; B. Chin; Michael Nicewicz; C. A. Russell; Wen Y. Wang; Leo B. Freeman; P. Hosier; L. E. LaFave; James L. Walsh; et al. (IBM J. Res. Dev., 1996)

Accelerated testing for cosmic soft-error rate. - James F. Ziegler; Hans P. Muhlfeld; Charles J. Montrose; Huntington W. Curtis; Timothy J. O'Gorman; Joseph M. Ross (IBM J. Res. Dev., 1996)

Cosmic ray soft error rates of 16-Mb DRAM memory chips. - James F. Ziegler; Martin E. Nelson; James Dean Shell; R. Jerry Peterson; Carl J. Gelderloos; Hans P. Muhlfeld; Charles J. Montrose (IEEE J. Solid State Circuits, 1998)