Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. - Jim Aarestad; Charles Lamech; Jim Plusquellic; Dhruva Acharyya; Kanak Agarwal 001 (DAC, 2011)

REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. - Charles Lamech; Jim Aarestad; Jim Plusquellic; Reza M. Rad; Kanak Agarwal 001 (ICCAD, 2011)

An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities. - Charles Lamech; Reza M. Rad; Mohammad Tehranipoor; Jim Plusquellic (IEEE Trans. Inf. Forensics Secur., 2011)

Trojan detection based on delay variations measured using a high-precision, low-overhead embedded test structure. - Charles Lamech; Jim Plusquellic (HOST, 2012)

A transmission gate physical unclonable function and on-chip voltage-to-digital conversion technique. - Raj Chakraborty; Charles Lamech; Dhruva Acharyya; Jim Plusquellic (DAC, 2013)

Stability analysis of a physical unclonable function based on metal resistance variations. - Jing Ju; Ray Chakraborty; Charles Lamech; Jim Plusquellic (HOST, 2013)

Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL. - Fareena Saqib; Dylan Ismari; Charles Lamech; Jim Plusquellic (IEEE Trans. Very Large Scale Integr. Syst., 2015)

On detecting delay anomalies introduced by hardware trojans. - Dylan Ismari; Jim Plusquellic; Charles Lamech; Swarup Bhunia; Fareena Saqib (ICCAD, 2016)