An organization for checking experiments on sequential circuits. - Charles R. Kime (IEEE Trans. Electron. Comput., 1966)

An Analysis Model for Digital System Diagnosis. - Charles R. Kime (IEEE Trans. Computers, 1970)

Structural Factors in the Fault Diagnosis of Combinational Networks. - Jeffrey D. Russell; Charles R. Kime (IEEE Trans. Computers, 1971)

Improved Procedures for Determining Diagnostic Resolution. - James C. Bassett; Charles R. Kime (IEEE Trans. Computers, 1972)

An Efficient Algorithm for Finding an Irredundant Set Cover. - Ramachendra P. Batni; Jeffrey D. Russell; Charles R. Kime (J. ACM, 1974)

Fault Tolerant Computing: An Introduction and a Perspective. - Charles R. Kime (IEEE Trans. Computers, 1975)

Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences". - Gernot Metze; Donald R. Schertz; Kilin To; Gordon Whitney; Charles R. Kime; Jeffrey D. Russell (IEEE Trans. Computers, 1975)

System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair. - Jeffrey D. Russell; Charles R. Kime (IEEE Trans. Computers, 1975)

System Fault Diagnosis: Closure and Diagnosability with Repair. - Jeffrey D. Russell; Charles R. Kime (IEEE Trans. Computers, 1975)

A Module-Level Testing Approach for Combinational Networks. - Ramachendra P. Batni; Charles R. Kime (IEEE Trans. Computers, 1976)

An Abstract Model for Digital System Fault Diagnosis. - Charles R. Kime (IEEE Trans. Computers, 1979)

A Two-Level Diagnostic Model for Digital Systems. - John A. McPherson; Charles R. Kime (IEEE Trans. Computers, 1979)

WISPAC: A Parallel Array Computer for Simulation Applications. - Vincent C. Rideout; J. Eastman; Adel Said Elmaghraby; Raphael A. Finkel; A. A. Frank; T. J. Kaminsky; Charles R. Kime; John A. McPherson; Michael Jon Redmond; S. Diane Smith (IMACS World Congress, 1982)

A Built-In Test Methodology for VLSI Data Paths. - Charles R. Kime; H. H. Kwan; J. K. Lemke; Gerald B. Williams (ITC, 1984)

Diagnosis in the Presence of Known Faults. - John A. McPherson; Charles R. Kime (IEEE Trans. Computers, 1984)

Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. - Gary L. Craig; Charles R. Kime (ITC, 1985)

Impact of Testability Standards on University Research and Instruction. - Charles R. Kime (ITC, 1988)

Concurrent Off-Phase Built-in Self-Test of Dormant Logic. - Leon J. Sigal; Charles R. Kime (ITC, 1988)

Test Scheduling and Control for VLSI Built-In Self-Test. - Gary L. Craig; Charles R. Kime; Kewal K. Saluja (IEEE Trans. Computers, 1988)

A concurrent testing technique for digital circuits. - Kewal K. Saluja; Rajiv Sharma; Charles R. Kime (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Scheduling unequal length tests in high performance VLSI system implementations. - John Y. Sayah; Charles R. Kime (ICCD, 1989)

Partial Scan by Use of Empirical Testability. - Kee Sup Kim; Charles R. Kime (ICCAD, 1990)

Multiple path sensitization for hierarchical circuit testing. - Chau-Chin Su; Charles R. Kime (ITC, 1990)

Computer-aided design of pseudoexhaustive BIST for semiregular circuits. - Chau-Chin Su; Charles R. Kime (ITC, 1990)

Test Scheduling in High Performance VLSI System Implementations. - John Y. Sayah; Charles R. Kime (IEEE Trans. Computers, 1992)

Partial Scan Using Reverse Direction Empirical Testability. - Kee Sup Kim; Charles R. Kime (ITC, 1993)

Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. - Danial J. Neebel; Charles R. Kime (ITC, 1993)

A Tutorial on Built-in Self-Test. I. Principles. - Vishwani D. Agrawal; Charles R. Kime; Kewal K. Saluja (IEEE Des. Test Comput., 1993)

A Tutorial on Built-In Self-Test, Part 2: Applications. - Vishwani D. Agrawal; Charles R. Kime; Kewal K. Saluja (IEEE Des. Test Comput., 1993)

A fault simulation method: Parallel pattern critical path tracing. - Byung S. So; Charles R. Kime (J. Electron. Test., 1993)

Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. - Mohammed F. AlShaibi; Charles R. Kime (ITC, 1994)

Multiple weighted cellular automata. - Danial J. Neebel; Charles R. Kime (VTS, 1994)

ICAT: incremental combinational ATPG. - Byung S. So; Charles R. Kime (VTS, 1994)

Partial scan flip-flop selection by use of empirical testability. - Kee Sup Kim; Charles R. Kime (J. Electron. Test., 1995)

MFBIST: A BIST Method for Random Pattern Resistant Circuits. - Mohammed F. AlShaibi; Charles R. Kime (ITC, 1996)

Cellular Automata for Weighted Random Pattern Generation. - Danial J. Neebel; Charles R. Kime (IEEE Trans. Computers, 1997)