Hall-effect measurements on short-channel devices using the van der Pauw Dual technique. - Andreas G. Andreou; Charles R. Westgate (Proc. IEEE, 1985)

Characterization of subthreshold MOS mismatch in transistors for VLSI systems. - Aleksandra Pavasovic; Andreas G. Andreou; Charles R. Westgate (J. VLSI Signal Process., 1994)

Reliability of thin films: Experimental study on mechanical and thermal behavior of indium tin oxide and poly(3, 4-ethylenedioxythiophene). - Atif Alkhazaili; Mohammad M. Hamasha; Gihoon Choi; Susan Lu; Charles R. Westgate (Microelectron. Reliab., 2015)