Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares. - Charles S. Whitman (Microelectron. Reliab., 2003)

Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. - Charles S. Whitman; Michael Meeder (Microelectron. Reliab., 2005)

Reliability results of HBTs with an InGaP emitter. - Charles S. Whitman (Microelectron. Reliab., 2006)

Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271]. - Charles S. Whitman (Microelectron. Reliab., 2006)

Determining factors affecting ESD failure voltage using DOE. - Charles S. Whitman; Terri M. Gilbert; Ann M. Rahn; Jennifer A. Antonell (Microelectron. Reliab., 2006)

Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. - Charles S. Whitman; Terri M. Gilbert; Ann M. Rahn; Jennifer A. Antonell (Microelectron. Reliab., 2006)

Defining the safe operating area for HBTs with an InGaP emitter across temperature and current density. - Charles S. Whitman (Microelectron. Reliab., 2007)

Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices. - Leslie Marchut; Charles S. Whitman (Microelectron. Reliab., 2008)

Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method. - Charles S. Whitman (Microelectron. Reliab., 2008)

Prediction of transmission line lifetimes over temperature and current density. - Charles S. Whitman (Microelectron. Reliab., 2009)

Impact of ambient temperature set point deviation on Arrhenius estimates. - Charles S. Whitman (Microelectron. Reliab., 2012)

Methodology for predicting off-state reliability in GaN power transistors. - Charles S. Whitman (Microelectron. Reliab., 2014)

Determination of safe reliability region over temperature and current density for through wafer vias. - Charles S. Whitman; Michael G. Meeder; Peter J. Zampardi (Microelectron. Reliab., 2017)