Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs. - Charna R. Parkey; Wasfy B. Mikhael; David B. Chester (MWSCAS, 2012)

Analyzing artifacts in the time domain waveform to locate wire faults. - Charna Parkey; Craig Hughes; Nicholas Locken (IEEE Instrum. Meas. Mag., 2012)

Time interleaved analog to digital converters: Tutorial 44. - Charna Parkey; Wasfy B. Mikhael (IEEE Instrum. Meas. Mag., 2013)

Linearized adaptation of non-linear post conversion correction for TIADCs: a behavioral model study. - Charna R. Parkey; Wasfy B. Mikhael (IEEE Instrum. Meas. Mag., 2015)