Invited - Cross-layer modeling and optimization for electromigration induced reliability. - Taeyoung Kim 001; Zeyu Sun 001; Chase Cook; Hengyang Zhao; Ruiwen Li; Daniel Wong 001; Sheldon X.-D. Tan (DAC, 2016)

Dynamic reliability management for near-threshold dark silicon processors. - Taeyoung Kim 001; Zeyu Sun 001; Chase Cook; Jagadeesh Gaddipati; Hai Wang 002; Hai-Bao Chen; Sheldon X.-D. Tan (ICCAD, 2016)

Finite difference method for electromigration analysis of multi-branch interconnects. - Chase Cook; Zeyu Sun 001; Taeyoung Kim 001; Sheldon X.-D. Tan (SMACD, 2016)

Fast physics-based electromigration analysis for multi-branch interconnect trees. - Xiaoyi Wang; Yan Yan; Jian He; Sheldon X.-D. Tan; Chase Cook; Shengqi Yang (ICCAD, 2017)

Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires. - Sheriff Sadiqbatcha; Chase Cook; Zeyu Sun 001; Sheldon X.-D. Tan (SMACD, 2018)

Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy. - Taeyoung Kim 001; Sheldon X.-D. Tan; Chase Cook; Zeyu Sun 001 (Integr., 2018)

Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). - Sheldon X.-D. Tan; Hussam Amrouch; Taeyoung Kim 001; Zeyu Sun 001; Chase Cook; Jörg Henkel (Integr., 2018)

Fast Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires. - Zeyu Sun 001; Ertugrul Demircan; Mehul D. Shroff; Chase Cook; Sheldon X.-D. Tan (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method. - Chase Cook; Zeyu Sun 001; Ertugrul Demircan; Mehul D. Shroff; Sheldon X.-D. Tan (IEEE Trans. Very Large Scale Integr. Syst., 2018)

GPU-based Ising Computing for Solving Balanced Min-Cut Graph Partitioning Problem. - Chase Cook; Wentian Jin; Sheldon X.-D. Tan (CoRR, 2019)

Reliability based hardware Trojan design using physics-based electromigration models. - Chase Cook; Sheriff Sadiqbatcha; Zeyu Sun 001; Sheldon X.-D. Tan (Integr., 2019)

GPU-based Ising computing for solving max-cut combinatorial optimization problems. - Chase Cook; Hengyang Zhao; Takashi Sato 001; Masayuki Hiromoto; Sheldon X.-D. Tan (Integr., 2019)

Simulation for Reliability, Hardware Security, and Ising Computing in VLSI Chip Design. - Chase Cook (2019)

Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution. - Xiaoyi Wang; Shaobin Ma; Sheldon X.-D. Tan; Chase Cook; Liang Chen 025; Jianlei Yang 001; Wenjian Yu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)