High thermal stability AlGaAs/InGaAs enhancement-mode pHEMT using palladium-gate technology. - Hsien-Chin Chiu; Chih-Wei Yang; Chao-Hung Chen; Che-Kai Lin; Jeffrey S. Fu; Hsing-Yuan Tu; Shiang-Feng Tang (Microelectron. Reliab., 2010)

High electrical performance liquid-phase HBr oxidation gate insulator of InAlAs/InGaAs metamorphic MOS-mHEMT. - Hsien-Chin Chiu; Chao-Hung Chen; Che-Kai Lin; Jeffrey S. Fu (Microelectron. Reliab., 2011)

Thermal stability investigations of AlGaN/GaN HEMTs with various high work function gate metal designs. - Hsien-Chin Chiu; Chao-Wei Lin; Che-Kai Lin; Hsuan-Ling Kao; Jeffrey S. Fu (Microelectron. Reliab., 2011)

High-k praseodymium oxide passivated AlGaN/GaN MOSFETs using P2S5/(NH4)2SX + UV interface treatment. - Chao-Wei Lin; Hsien-Chin Chiu; Che-Kai Lin; Jeffrey S. Fu (Microelectron. Reliab., 2011)

Investigation of surface pretreatments on GaAs and memory characteristics of MOS capacitors embedded with Au nano-particles. - Hsien-Chin Chiu; Che-Kai Lin; Chao-Wei Lin; Chao-Sung Lai (Microelectron. Reliab., 2012)

Investigation on the thermal behavior of 0.15 μm gate-length In0.4Al0.6As/In0.4Ga0.6As MHEMT. - Che-Kai Lin; Hsien-Chin Chiu; Chao-Wei Lin; Hsuan-Ling Kao; Feng-Tso Chien (Microelectron. Reliab., 2012)

Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology. - Ming-Hung Weng; Chao-Hung Chen; Che-Kai Lin; Shih-Hui Huang; Jhih-Han Du; Sheng-Wen Peng; Walter Wohlmuth; Frank Yung-Shi Chou; Chang-Hwang Hua (Microelectron. Reliab., 2014)