Fully testable PLA design with minimal extra input. - Che W. Chiou; Ted C. Yang (EURO-DAC, 1990)

Universal syndrome-testable design of programmable logic arrays. - Ted C. Yang; Che W. Chiou (Integr., 1990)

Testable PLA design with minimal overheads. - Ted C. Yang; Che W. Chiou (Integr., 1990)