Circuit Level Reliability Analysis of Cu Interconnects. - Syed M. Alam; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (ISQED, 2004)

Electromigration Reliability Comparison of Cu and Al Interconnects. - Syed M. Alam; Frank L. Wei; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (ISQED, 2005)

Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations. - Syed M. Alam; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (Microelectron. J., 2007)

Numerical and experimental study on Cu protrusion of Cu-filled through-silicon vias (TSV). - Fa Xing Che; Wahyuaji Narottama Putra; A. Heryanto; A. Trigg; S. Gao; Chee Lip Gan (3DIC, 2011)

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. - Fulvio Infante; Philippe Perdu; H. B. Kor; Chee Lip Gan; Dean Lewis (Microelectron. Reliab., 2011)

Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress. - Meng Keong Lim; Jingyuan Lin; Yong Chiang Ee; Chee Mang Ng; Jun Wei; Chee Lip Gan (Microelectron. Reliab., 2012)

Electrical behavior of Au-Ge eutectic solder under aging for solder bump application in high temperature Electronics. - F. L. Lau; Riko I. Made; Wahyuaji Narottama Putra; J. Z. Lim; V. C. Nachiappan; J. L. Aw; Chee Lip Gan (Microelectron. Reliab., 2013)

Bidirectional electromigration failure. - M. K. Lim; Vassilios A. Chouliaras; Chee Lip Gan; Vincent M. Dwyer (Microelectron. Reliab., 2013)

Ultra-fine pitch palladium-coated copper wire bonding: Effect of bonding parameters. - Adeline B. Y. Lim; Andrew C. K. Chang; Oranna Yauw; Bob Chylak; Chee Lip Gan; Zhong Chen 004 (Microelectron. Reliab., 2014)

Customized glass sealant for ceramic substrates for high temperature electronic application. - Ahmed Sharif; Chee Lip Gan; Zhong Chen 004 (Microelectron. Reliab., 2014)

Copper micro and nano particles mixture for 3D interconnections application. - Yuan Yuan Dai; Mei Zhen Ng; P. Anantha; Chee Lip Gan; Chuan Seng Tan (3DIC, 2015)

Origin of physical degradation in AlGaN/GaN on Si high electron mobility transistors under reverse bias stressing. - Wardhana A. Sasangka; Govindo J. Syaranamual; Chee Lip Gan; Carl V. Thompson (IRPS, 2015)

Unsupervised learning for signal mapping in dynamic photon emission. - Samuel Chef; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak; Chee Lip Gan (Microelectron. Reliab., 2015)

Comprehensive Laser Sensitivity Profiling and Data Register Bit-Flips for Cryptographic Fault Attacks in 65 Nm FPGA. - Wei He 015; Jakub Breier; Shivam Bhasin; Dirmanto Jap; Hock Guan Ong; Chee Lip Gan (SPACE, 2016)

Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. - Chung Tah Chua; Hock Guan Ong; Kevin Sanchez; Philippe Perdu; Chee Lip Gan (Microelectron. Reliab., 2016)

Interfacial evolution and bond reliability in thermosonic Pd coated Cu wire bonding on aluminum metallization: Effect of palladium distribution. - Adeline B. Y. Lim; Chris B. Boothroyd; Oranna Yauw; Bob Chylak; Chee Lip Gan; Zhong Chen 004 (Microelectron. Reliab., 2016)

Evaluation of the corrosion performance of Cu-Al intermetallic compounds and the effect of Pd addition. - Adeline B. Y. Lim; Wei Jian Neo; Oranna Yauw; Bob Chylak; Chee Lip Gan; Zhong Chen 004 (Microelectron. Reliab., 2016)

Atmospheric corrosion resistance of electroplated Ni/Ni-P/Au electronic contacts. - Vinod K. Murugan; Zhigang Jia; Govindo J. Syaranamual; Chee Lip Gan; Yizhong Huang; Zhong Chen 004 (Microelectron. Reliab., 2016)

Role of two-dimensional electron gas (2DEG) in AlGaN/GaN high electron mobility transistor (HEMT) ON-state degradation. - Govindo J. Syaranamual; Wardhana A. Sasangka; Riko I. Made; Subramaniam Arulkumaran; Geok Ing Ng; Siew Chuen Foo; Chee Lip Gan; Carl V. Thompson (Microelectron. Reliab., 2016)

Extensive Laser Fault Injection Profiling of 65 nm FPGA. - Jakub Breier; Wei He 015; Shivam Bhasin; Dirmanto Jap; Samuel Chef; Hock Guan Ong; Chee Lip Gan (J. Hardw. Syst. Secur., 2017)

Characterisation of defects generated during constant current InGaN-on-silicon LED operation. - Riko I. Made; Yu Gao; Govindo J. Syaranamual; Wardhana A. Sasangka; L. Zhang; Xuan Sang Nguyen; Y. Y. Tay; Jason Scott Herrin; Carl V. Thompson; Chee Lip Gan (Microelectron. Reliab., 2017)

Improved reliability of AlGaN/GaN-on-Si high electron mobility transistors (HEMTs) with high density silicon nitride passivation. - Wardhana A. Sasangka; Govindo J. Syaranamual; Y. Gao; Riko I. Made; Chee Lip Gan; Carl V. Thompson (Microelectron. Reliab., 2017)

Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors. - Wardhana A. Sasangka; Yu Gao; Chee Lip Gan; Carl V. Thompson (Microelectron. Reliab., 2018)

Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU. - Samuel Chef; Chung Tah Chua; Jing Yun Tay; Jason Cheah; Chee Lip Gan (FDTC, 2022)

Selective Staining on Non-Volatile Memory Cells for Data Retrieval. - Xiao Mei Zeng; Qing Liu 005; Jing Yun Tay; Chee Lip Gan (IEEE Trans. Inf. Forensics Secur., 2022)

A Security Assessment of Protected Execute-Only Firmware in Microcontrollers Through Selective Chemical Engraving. - Xiaomei Zeng; Qing Liu 005; Samuel Chef; Chee Lip Gan (HOST, 2024)

Explainable automated data estimation in Logic State Imaging of embedded SRAM. - Samuel Chef; Chung Tah Chua; Jing Yun Tay; Chee Lip Gan (ISCAS, 2024)

A Comprehensive Data Retrieval and Correction Approach From 40-nm Flash Memory With Selective Chemical Engraving. - Xiao Mei Zeng; Qing Liu 005; Chee Lip Gan (IEEE Trans. Inf. Forensics Secur., 2024)