Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment. - A. Bezza; M. Rafik; David Roy 001; X. Federspiel; P. Mora; Cheikh Diouf; Vincent Huard; Gérard Ghibaudo (IRPS, 2015)

A new method for quickly evaluating reversible and permanent components of the BTI degradation. - Xavier Garros; Alexandre Subirats; Gilles Reimbold; Fred Gaillard; Cheikh Diouf; X. Federspiel; Vincent Huard; M. Rafik (IRPS, 2018)

AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment. - M. Rafik; A. P. Nguyen; Xavier Garros; M. Arabi; X. Federspiel; Cheikh Diouf (IRPS, 2018)

Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement. - Florian Cacho; X. Federspiel; D. Nouguier; Cheikh Diouf (IRPS, 2019)

Process Optimization for HCI Improvement in I/O Analog Devices. - Cheikh Diouf; N. Guitard; M. Rafik; J. J. Martinez; X. Federspiel; Alain Bravaix; D. Muller; David Roy 001 (IRPS, 2019)

Comparison of variability of HCI induced drift for SiON and HKMG devices. - Xavier Federspiel; Cheikh Diouf; Florian Cacho; Emmanuel Vincent 004 (IRPS, 2020)

HCI Temperature sense effect from 180nm to 28nm nodes. - Xavier Federspiel; Abdourahmane Camara; Audrey Michard; Cheikh Diouf; Florian Cacho (IRPS, 2021)

Insight Into HCI Reliability on I/O Nitrided Devices. - C. Doyen; V. Yon; Xavier Garros; Luigi Basset; Tadeu Mota Frutuoso; C. Dagon; Cheikh Diouf; X. Federspiel; V. Millon; Frederic Monsieur; C. Pribat; David Roy 001 (IRPS, 2023)

A Versatile 55-nm SiGe BiCMOS Technology for Wired, Wireless, and Satcom Applications. - Pascal Chevalier 002; Florian Cacho; C. Durand; N. Derrier; V. Millon; Frederic Monsieur; A. Gauthier; P. Billy; Sébastien Fregonese; Thomas Zimmer; H. Audouin; Michel Buczko; et al. (BCICTS, 2024)

Non-conducting Hot carrier temperature activation and temperature sense effect. - X. Federspiel; Cheikh Diouf; B. Arunachalam; David Roy 001; Florian Cacho (IRPS, 2024)