Chen Wang

According to our database, Chen Wang authored at least 22 papers between 2001 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Efficient Test Compression Configuration Selection.

Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations.

Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2020

Low Cost Hypercompression of Test Data.

Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations.

Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada

Proceedings of the IEEE International Test Conference, 2020

2019

TEA: A Test Generation Algorithm for Designs with Timing Exceptions.

Naixing Wang, Chen Wang, Kun-Han Tsai, Wu-Tung Cheng, Xijiang Lin, Mark Kassab, Irith Pomeranz

Proceedings of the 28th IEEE Asian Test Symposium, 2019

2018

Hypercompression of Test Patterns.

Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang

Proceedings of the IEEE International Test Conference, 2018

2017

Trimodal Scan-Based Test Paradigm.

Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang

IEEE Trans. Very Large Scale Integr. Syst., 2017

2015

Isometric Test Data Compression.

Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm.

Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Chen Wang

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

Isometric test compression with low toggling activity.

Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang

Proceedings of the 2014 International Test Conference, 2014

2013

On the generation of compact test sets.

Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Chen Wang

Proceedings of the 2013 IEEE International Test Conference, 2013

2007

Isolation of Failing Scan Cells through Convolutional Test Response Compaction.

Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer

J. Electron. Test., 2007

2006

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.

Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo

Proceedings of the 15th Asian Test Symposium, 2006

2005

Finite memory test response compactors for embedded test applications.

Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios.

Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

Convolutional compaction-driven diagnosis of scan failures.

Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang

Proceedings of the 10th European Test Symposium, 2005

Defect Aware Test Patterns.

Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz

Proceedings of the 2005 Design, 2005

2004

Fault Diagnosis in Designs with Convolutional Compactors.

Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Convolutional Compaction of Test Responses.

Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

On Compacting Test Response Data Containing Unknown Values.

Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Jerzy Tyszer

Proceedings of the 2003 International Conference on Computer-Aided Design, 2003

2002

Conflict driven techniques for improving deterministic test pattern generation.

Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski

Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002

2001

REDI: An Efficient Fault Oriented Procedure to Identify Redundant Faults in Combinational Logic Circuits.

Chen Wang, Irith Pomeranz, Sudhakar M. Reddy

Proceedings of the 2001 IEEE/ACM International Conference on Computer-Aided Design, 2001